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Advantages of the 1200 V SiC Schottky Diode with MPS Design - Technical  Articles
Advantages of the 1200 V SiC Schottky Diode with MPS Design - Technical Articles

Increasing carrier lifetimes for high-voltage silicon carbide
Increasing carrier lifetimes for high-voltage silicon carbide

Figure 1 from Breakdown characteristics of 12–20 kV-class 4H-SiC PiN diodes  with improved junction termination structures | Semantic Scholar
Figure 1 from Breakdown characteristics of 12–20 kV-class 4H-SiC PiN diodes with improved junction termination structures | Semantic Scholar

Advantages of the 1200 V SiC Schottky Diodes with MPS Design | Mouser
Advantages of the 1200 V SiC Schottky Diodes with MPS Design | Mouser

Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton  implantation to solve bipolar degradation | Scientific Reports
Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton implantation to solve bipolar degradation | Scientific Reports

Design and Optimization of Silicon Carbide Schottky Diode - Technical  Articles
Design and Optimization of Silicon Carbide Schottky Diode - Technical Articles

4.4.2.2 PiN Diode Simulation
4.4.2.2 PiN Diode Simulation

Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton  implantation to solve bipolar degradation | Scientific Reports
Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton implantation to solve bipolar degradation | Scientific Reports

SiC extreme - Chair of Physics of Electrotechnology
SiC extreme - Chair of Physics of Electrotechnology

4H-SiC p-i-n diode schematic cross section. Plot not in scale. | Download  Scientific Diagram
4H-SiC p-i-n diode schematic cross section. Plot not in scale. | Download Scientific Diagram

Radiation tolerance analysis of 4H-SiC PIN diode detectors for neutron  irradiation - ScienceDirect
Radiation tolerance analysis of 4H-SiC PIN diode detectors for neutron irradiation - ScienceDirect

Depth Distribution of Defects in SiC PiN Diodes Formed Using Ion  Implantation or Epitaxial Growth - Fukaya - 2022 - physica status solidi  (b) - Wiley Online Library
Depth Distribution of Defects in SiC PiN Diodes Formed Using Ion Implantation or Epitaxial Growth - Fukaya - 2022 - physica status solidi (b) - Wiley Online Library

Effect of Ultraviolet Irradiation on 4H-SiC PiN Diodes Characteristics |  SpringerLink
Effect of Ultraviolet Irradiation on 4H-SiC PiN Diodes Characteristics | SpringerLink

SiC PiN Diodes - GeneSiC | Mouser
SiC PiN Diodes - GeneSiC | Mouser

Forward I–V characteristics of 4H-SiC PiN diodes after each RTA at... |  Download Scientific Diagram
Forward I–V characteristics of 4H-SiC PiN diodes after each RTA at... | Download Scientific Diagram

FEM-based analysis of avalanche ruggedness of high voltage SiC Merged-PiN-Schottky  and Junction-Barrier-Schottky diodes - ScienceDirect
FEM-based analysis of avalanche ruggedness of high voltage SiC Merged-PiN-Schottky and Junction-Barrier-Schottky diodes - ScienceDirect

Component Technologies for Ultra-High-Voltage 4H-SiC pin Diode |  Scientific.Net
Component Technologies for Ultra-High-Voltage 4H-SiC pin Diode | Scientific.Net

V Si in SiC p-i-n junction device. (a) Schematic of the p-i-n diode... |  Download Scientific Diagram
V Si in SiC p-i-n junction device. (a) Schematic of the p-i-n diode... | Download Scientific Diagram

PDF) A comparative study between 4H-SiC and silicon power PiN diode having  the same breakdown voltage 4KV | kamel BESBES - Academia.edu
PDF) A comparative study between 4H-SiC and silicon power PiN diode having the same breakdown voltage 4KV | kamel BESBES - Academia.edu

Advantages of the 1200 V SiC Schottky Diode with MPS Design
Advantages of the 1200 V SiC Schottky Diode with MPS Design

Figure 1 from Large chip area SiC PiN diodes demonstrated for thyristor  protection in a pulsed system | Semantic Scholar
Figure 1 from Large chip area SiC PiN diodes demonstrated for thyristor protection in a pulsed system | Semantic Scholar

Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed  by Various Profiles and Temperatures
Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures

4.4.2.2 PiN Diode Simulation
4.4.2.2 PiN Diode Simulation

Energies | Free Full-Text | 10 kV Silicon Carbide PiN Diodes—From Design to  Packaged Component Characterization
Energies | Free Full-Text | 10 kV Silicon Carbide PiN Diodes—From Design to Packaged Component Characterization

a) Schematic illustration of the 4H-SiC p-i-n diode: d = 5 µm; all... |  Download Scientific Diagram
a) Schematic illustration of the 4H-SiC p-i-n diode: d = 5 µm; all... | Download Scientific Diagram